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Qualifying exam: In‐situ Characterization of Electrical Properties of 2D Material by Atomic Force Micros-copy

PhD student Xuya Xiong, iNANO

2021.02.12 | Mie Meulengracht Christensen

Date Fri 05 Mar
Time 14:00 16:00
Location Will be held online


External examiner: Professor Peter Bøggild, Department of Physics, Technical University of Denmark

Internal examiner: Professor Duncan Sutherland, iNANO, Aarhus University

Examiner / Main supervisor: Associate Professor Mingdong Dong, iNANO, Aarhus University

To receive a link to the event, please send an e-mail to Mingdong Dong, dong@inano.au.dk

Talent development, PhD students
16881 / i43