Qualifying exam: Developing new electron microscopy and X-ray diffraction-based methodologies for studies of disordered materials
PhD student Rebekka Klemmt, iNANO
Info about event
Time
Location
1590-213, iNANO, Aarhus University, Gustav Wieds Vej 14, 8000 Aarhus C
Examiners:
External examiner: Associate Professor Kirsten M. Ø. Jensen, Department of Chemistry, University of Copenhagen
Internal examiner: Professor Jeppe Vang Lauritsen, iNANO, Aarhus University
Examiner / Main supervisor: Professor Dorthe Ravnsbæk, iNANO and Department of Chemistry, Aarhus University
Examiner / Co-supervisor: Assistant Professor Espen Drath Bøjesen, iNANO, Aarhus University